A highly precise shape-noise-free shear bias estimator

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Authors: A. Pujol, M. Kilbinger, F. Sureau & J. Bobin
Journal:  
Year: 06/2018
Download: ADS| Arxiv


Abstract

We present a new method to estimate shear measurement bias in image simulations that significantly improves its precision with respect to the state-of-the-art methods. This method is based on measuring the shear response for individual images. We generate sheared versions of the same image to measure how the shape measurement changes with the changes in the shear, so that we obtain a shear response for each original image, as well as its additive bias. Using the exact same noise realizations for each sheared version allows us to obtain an exact estimation of its shear response. The estimated shear bias of a sample of galaxies comes from the measured averages of the shear response and individual additive bias. The precision of this method supposes an improvement with respect to previous methods since our method is not affected by shape noise. As a consequence, the method does not require shape noise cancellation for a precise estimation of shear bias. The method can be easily applied to many applications such as shear measurement validation and calibration, reducing the number of necessary simulated images by a few orders of magnitude to achieve the same precision requirements.

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Author: Samuel Farrens

I have been a postdoctoral researcher at CEA Saclay since October 2015. I am currently working on the DEDALE project and the Euclid mission with Jean-Luc Starck.

My background is in optical detection of clusters of galaxies and photometric redshift estimation. I am now branching out into the field of PSF estimation using sparse signal processing techniques.

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